Register Here To View: MEMS Accelerometers – Technology Review and Implications for CBM

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WEBINAR DESCRIPTION:

Wireless condition monitoring systems, also known as IIoT, promises easily deployed ‘continuous’ condition monitoring, with the potential to save some of that most precious commodity – your time. MEMS accelerometers have been instrumental in enabling the proliferation of these systems, but lingering concerns about MEMS performance add uncertainty to an already complex solution landscape.

In this session we will compare and contrast MEMS accelerometer technology with legacy PZT, discussing the implications for IIoT and CBM applications in general. We will demonstrate how MEMS performance improvements made over the last 5 years not only supports overalls trending but also enables bearing fault detection and diagnostics. With a better understanding of the underlying sensor technology strengths and limitations, we will also show how MEMS accelerometer performance positioning data suggests using caution when selecting wireless IIoT solutions for your assets.

Learning Takeaways:

1. A better understanding of sensor technology performance and feature trade-offs, with implications for vibration measurement and asset condition monitoring.
2. An analysis and comparison of accelerometer technology performance for commonly used monitoring and diagnostic algorithms, in particular velocity calculations and enveloping for bearing fault detection and diagnostics.
3. Better understanding of the implications of MEMS accelerometer technology performance on IIoT solution positioning will help inform wireless system choices for the maintenance specialist.
4. See how chip-scale MEMS sensors help enable embedded ‘digital’ sensors, supporting an emerging trend among OEMs.

ABOUT THE PRESENTERS

Ed Spence is the Founder and Managing Director of The Machine Instrumentation Group, a collaborative network of contract engineering service providers helping clients define and develop new sensors for machine health applications.

Previously, Ed was the Marketing Manager for Analog Devices MEMS Sensor Technology Group (2008 – 2017), where he defined the MEMS accelerometer roadmap for vibration based Condition Monitoring, winning an Innovation Award at Sensors Expo 2017 for the flagship ADXL1002 MEMS accelerometer. Ed has published or presented on the subject of sensors for CBM on numerous occasions.

Adam Jablonski is Principle R&D Specialist for AGH University of Science and Technology in Krakow, Poland. For last 15 years, he worked for various branches of industry. Adam has authored numerous papers on the subject of vibration-based condition monitoring.  Recently, he published a book (Springer 2021) “Condition Monitoring Algorithms in MATLAB®”, which offers comprehensive and practice-oriented guide to condition monitoring algorithms in MATLAB®. Adam also serves on the Board of Directors for The Society for Machinery Failure Prevention Technology.