MEMS Technology
Webinars
Untangling IoT for Condition Monitoring
New IIoT (Industrial Internet of Things) wireless solutions for Condition-Based Monitoring (CBM) seem to appear on the market so frequently it’s hard to keep track of them all. Many of these new systems bring with them new technologies such as AI and machine learning, MEMS sensor technology and automated diagnostics – technologies that present the reliability and maintenance engineer with both challenges and opportunities.
The new capabilities offer the promise of wireless data collection and near continuous time monitoring while saving you valuable time. You would like test some of these systems, but it’s a substantial investment in time, energy and money. This talk will help you better understand some of the features and functions of wireless CBM, discussing some technology dependencies and a few other things to think about when considering piloting a system.
- Ed Spence
- The Machine Instrumentation Group
Two Minute Tips
Detecting and Diagnosing Imbalance in a System
Next-generation sensors based on MEMS technology, combined with advanced algorithms for diagnostic and prognostic applications, expand opportunities to measure a variety of machines and improve the ability to effectively monitor equipment, improve uptime, enhance process quality, and increase throughput. This 2 minute tip reviews imbalance faults and their characteristics to provide insights into some of the key system requirements that must be considered when developing a condition-based monitoring solution.
- Pete Sopcik
- Analog Devices, Inc
