Description:
New IIoT (Industrial Internet of Things) wireless solutions for Condition-Based Monitoring (CBM) seem to appear on the market so frequently it’s hard to keep track of them all. Many of these new systems bring with them new technologies such as AI and machine learning, MEMS sensor technology and automated diagnostics – technologies that present the reliability and maintenance engineer with both challenges and opportunities.

The new capabilities offer the promise of wireless data collection and near continuous time monitoring while saving you valuable time. You would like test some of these systems, but it’s a substantial investment in time, energy and money.
This talk will help you better understand some of the features and functions of wireless CBM, discussing some technology dependencies and a few other things to think about when considering piloting a system.

Learning takeaways:
• System positioning with performance features such as battery life and vendor PdM ‘pedigree’
• Various networking options as a starting point for system selection
• A review of accelerometer technology ‘under the hood’ will help you better understand the diagnostic capabilities and limitations of the many MEMS based wire

About the Presenter:
Ed Spence is the Founder and Managing Director of The Machine Instrumentation Group, a consultant representing a network of contract engineering service providers with expertise in Condition Monitoring, sensor design, signal processing and data engineering.
Previously, Ed was the Marketing Manager for Analog Devices MEMS Sensor Technology Group, where he defined the MEMS accelerometer roadmap for vibration based Condition Monitoring, winning an Innovation Award at Sensors Expo 2017 for the flagship ADXL1002 MEMS accelerometer. Ed has been engaged in the development of Condition Monitoring sensor solutions since 2008.